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Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination
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Preise | 2013 | 2014 | 2015 | 2019 |
---|---|---|---|---|
Schnitt | Fr. 263.38 (€ 269.47)¹ | Fr. 291.73 (€ 298.48)¹ | Fr. 343.97 (€ 351.92)¹ | Fr. 212.67 (€ 217.59)¹ |
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Anomalous X-Ray Scattering for Materials Characterization Atomic-Scale Structure Determination Springer Tracts in Modern Physics Volume 179
ISBN: 9783662146378 bzw. 3662146371, Band: 179, in Deutsch, Springer, Taschenbuch, neu.
Paperback. 214 pages. Dimensions: 9.2in. x 6.1in. x 0.5in.The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the CoCu type multi layers, for example, magnetoresistance has been found as large as 80 at 4. 2 K and 50 at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called bulk amorphous alloys, have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN.
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics) (Volume 179)
ISBN: 9783662146378 bzw. 3662146371, in Deutsch, gebraucht.
Von Händler/Antiquariat, AB Books.
Good. Used Good- We ship from multiple locations. May require an extra 1-2 days to process. We take care of the customer and customer will take care of our business.
Anomalous X-Ray Scattering for Materials Characterization
ISBN: 9783662146378 bzw. 3662146371, vermutlich in Englisch, Springer Shop, Taschenbuch, neu.
The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions. Soft cover.
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination
ISBN: 9783662146378 bzw. 3662146371, vermutlich in Englisch, neu.
The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics) (2002)
ISBN: 9783540434436 bzw. 3540434437, in Englisch, 214 Seiten, 2002. Ausgabe, Springer, gebundenes Buch, gebraucht.
Mpya kutoka: $256.69 (21 Inatoa)
Kutumika kutoka: $182.00 (10 Inatoa)
Onyesha zaidi 31 Inatoa katika Amazon.com
Von Händler/Antiquariat, southlandplace.
The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys", have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions. Hardcover, Toleo la: 2002, Lebo: Springer, Springer, Kikundi cha bidhaa: Book, Kuchapishwa: 2002-10-03, Studio: Springer, Cheo ya mauzo: 6797475.
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (2015)
ISBN: 9783662146378 bzw. 3662146371, in Deutsch, SPRINGER VERLAG GMBH 01/06/2015, Taschenbuch, neu.
New Book. Shipped from US within 10 to 14 business days. Established seller since 2000. This item is printed on demand.
Anomalous X-Ray Scattering for Materials Characterization
ISBN: 9783540434436 bzw. 3540434437, in Englisch, Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, gebundenes Buch, neu.
Anomalous X-Ray Scattering for Materials Characterization
ISBN: 9783540434436 bzw. 3540434437, in Deutsch, Springer, gebundenes Buch, neu, Erstausgabe.
Von Händler/Antiquariat, Cold Books.
Springer . hardcover. New. pp. xiv + 214 1st Edition.
Anomalous X-Ray Scattering for Materials Characterization (2013)
ISBN: 9783662146378 bzw. 3662146371, in Deutsch, Springer Verlag Gmbh Dez 2013, Taschenbuch, neu, Nachdruck.
This item is printed on demand - Print on Demand Titel. Neuware - Englisch.
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (Springer Tracts in Modern Physics)
ISBN: 9783540434436 bzw. 3540434437, in Deutsch, Springer, gebundenes Buch, neu.
Von Händler/Antiquariat, Russell Books Ltd.
Springer. Hardcover. 3540434437 Special order direct from the distributor . New.