Beam Injection Assessment of Defects in Semiconductors (Solid State Phenomena)
7 Angebote vergleichen
Bester Preis: Fr. 57.05 (€ 58.46)¹ (vom 20.04.2018)1
Beam Injection Assessment of Defects in Semiconductors (Solid State Phenomena)
DE PB USISBN: 9783908450399 bzw. 390845039X, in Deutsch, . Taschenbuch, gebraucht.
Von Händler/Antiquariat, History Bookshop [1068180], Bourton on the Water, GLOS, United Kingdom.
A very good copy with minor wear. For non-UK markets items of 1.5 kg or more may require an additional shipping charge Inscription to ffep. CLean otherwise.
A very good copy with minor wear. For non-UK markets items of 1.5 kg or more may require an additional shipping charge Inscription to ffep. CLean otherwise.
2
Beam Injection Assessment of Defects in Semiconductors
EN NW EB DLISBN: 9783035706826 bzw. 3035706824, in Englisch, neu, E-Book, elektronischer Download.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
The 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98) focussed on many theoretical and experimental aspects of this topic. The aim was to bring together specialists working in the fields of both fundamental research and applications. There were more than 80 participants from 15 countries all over the world.
The 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98) focussed on many theoretical and experimental aspects of this topic. The aim was to bring together specialists working in the fields of both fundamental research and applications. There were more than 80 participants from 15 countries all over the world.
3
Beam Injection Assessment of Defects in Semiconductors (Solid State Phenomena) (1998)
EN PB USISBN: 9783908450399 bzw. 390845039X, in Englisch, 552 Seiten, Trans Tech, Taschenbuch, gebraucht.
Lieferung aus: Deutschland, Versandfertig in 1 - 2 Werktagen, Versandkostenfrei. Tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, Books N planet.
Taschenbuch, Label: Trans Tech, Trans Tech, Produktgruppe: Book, Publiziert: 1998, Studio: Trans Tech.
Von Händler/Antiquariat, Books N planet.
Taschenbuch, Label: Trans Tech, Trans Tech, Produktgruppe: Book, Publiziert: 1998, Studio: Trans Tech.
4
Beam Injection Assessment of Defects in Semiconductors (Solid State Phenomena) (1998)
EN PB NWISBN: 9783908450399 bzw. 390845039X, in Englisch, 552 Seiten, Trans Tech, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandfertig in 1 - 2 Werktagen, Versandkostenfrei. Tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, overseasboutique.
Taschenbuch, Label: Trans Tech, Trans Tech, Produktgruppe: Book, Publiziert: 1998, Studio: Trans Tech.
Von Händler/Antiquariat, overseasboutique.
Taschenbuch, Label: Trans Tech, Trans Tech, Produktgruppe: Book, Publiziert: 1998, Studio: Trans Tech.
5
International Workshop on [title] (6th: 2000: Fukuoka, Japan) Ed. by Hajime Tomokage and Takashi Sekiguchi.
Beam injection assessment of microstructures in semiconductors (BIAMS ; proceedings. (Solid state [henomena; v.78-79) (2000)
DE PBISBN: 9783908450610 bzw. 3908450616, in Deutsch, Scitec Publications, Ltd. Taschenbuch.
Von Händler/Antiquariat, Gulls Nest Books, Inc. [2192], Portland, OR, U.S.A.
Brand NEW! Paperback.
Brand NEW! Paperback.
6
Beam injection assessment of microstructures in semiconductors (BIAMS 2000); proceedings (2000)
DE PB NWISBN: 9783908450610 bzw. 3908450616, in Deutsch, Scitec Publications, Ltd. 1, Taschenbuch, neu.
Von Händler/Antiquariat, Powell's Books [9859], Portland, OR, U.S.A.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Lade…