Advanced Measurement and Test - 3 Angebote vergleichen
Bester Preis: Fr. 155.85 (€ 159.42)¹ (vom 28.11.2021)1
Advanced Measurement and Test
EN NW EB DLISBN: 9783038136279 bzw. 3038136271, in Englisch, neu, E-Book, elektronischer Download.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
Volume is indexed by Thomson Reuters CPCI-S (WoS).This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
Volume is indexed by Thomson Reuters CPCI-S (WoS).This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
2
Advanced Measurement and Test
EN NW EB DLISBN: 9783038136279 bzw. 3038136271, in Englisch, neu, E-Book, elektronischer Download.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
Volume is indexed by Thomson Reuters CPCI-S (WoS).This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
Volume is indexed by Thomson Reuters CPCI-S (WoS).This second collection on “Advanced Measurement and Test II” is dedicated to the electronic testing of devices, boards and systems; covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis … and back to process and design improvement. This will be an invaluable guide to the topics.
3
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Advanced Measurement and Test (2011)
DE NW EB DLISBN: 9783038136279 bzw. 3038136271, in Deutsch, Trans Tech Publications, neu, E-Book, elektronischer Download.
Lieferung aus: Deutschland, Versandkostenfrei.
Advanced Measurement and Test: Volume is indexed by Thomson Reuters CPCI-S (WoS).This second collection on "e Advanced Measurement and Test II"e is dedicated to the electronic testing of devices, boards and systems covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testing techniques, and mechanical and electrical engineering. Many of the Chinese researchers have multiple papers in the proceedings. For example, six papers from a Tianjin Polytechnic team report on the synthesis of PEG2000 lauric acid diester and polyamic acid, the performance of a polysiloxane antifoaming agent, the properties of modified co-polyester fibers, and analysis of a strongly acidic alkyl phosphate. Other topics include a laser measuring instrument for tunnel surfaces, the ERP detection of mental arithmetic strategies, fault diagnosis on telecommunication networks, a photovoltaic supercapacitor and battery hybrid storage system, and a sunlight intensity measurement device. Englisch, Ebook.
Advanced Measurement and Test: Volume is indexed by Thomson Reuters CPCI-S (WoS).This second collection on "e Advanced Measurement and Test II"e is dedicated to the electronic testing of devices, boards and systems covering the complete cycle from design verification, design-for-testing, design-for-manufacturing, silicon de-bugging, manufacturing testing, system testing, diagnosis, failure analysis ... and back to process and design improvement. This will be an invaluable guide to the topics.Three hundred and twenty-four papers from the June 2011 conference are arranged into three volumes on material science and technology, measuring and testing techniques, and mechanical and electrical engineering. Many of the Chinese researchers have multiple papers in the proceedings. For example, six papers from a Tianjin Polytechnic team report on the synthesis of PEG2000 lauric acid diester and polyamic acid, the performance of a polysiloxane antifoaming agent, the properties of modified co-polyester fibers, and analysis of a strongly acidic alkyl phosphate. Other topics include a laser measuring instrument for tunnel surfaces, the ERP detection of mental arithmetic strategies, fault diagnosis on telecommunication networks, a photovoltaic supercapacitor and battery hybrid storage system, and a sunlight intensity measurement device. Englisch, Ebook.
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