Electron Microscopy XIV - 3 Angebote vergleichen

Bester Preis: Fr. 106.50 ( 108.94)¹ (vom 28.11.2021)
1
9783038136996 - Electron Microscopy XIV

Electron Microscopy XIV (2011)

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika EN NW EB DL

ISBN: 9783038136996 bzw. 3038136999, in Englisch, neu, E-Book, elektronischer Download.

Fr. 106.50 ($ 123.00)¹
versandkostenfrei, unverbindlich
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisła, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences. Volume is indexed by Thomson Reuters CPCI-S (WoS).The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.
2
9783038136996 - Electron Microscopy XIV

Electron Microscopy XIV (2011)

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika EN NW EB DL

ISBN: 9783038136996 bzw. 3038136999, in Englisch, neu, E-Book, elektronischer Download.

Fr. 106.86 (C$ 157.38)¹
versandkostenfrei, unverbindlich
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisła, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences. Volume is indexed by Thomson Reuters CPCI-S (WoS).The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.
3
9783038136996 - Krystian Prusik: Electron Microscopy XIV
Symbolbild
Krystian Prusik

Electron Microscopy XIV (2011)

Lieferung erfolgt aus/von: Deutschland DE NW EB DL

ISBN: 9783038136996 bzw. 3038136999, in Deutsch, Trans Tech Publications, neu, E-Book, elektronischer Download.

Fr. 219.31 ( 224.33)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkostenfrei.
Electron Microscopy XIV: These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisla, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences. Volume is indexed by Thomson Reuters CPCI-S (WoS).The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.Researchers from different countries exchange recent experiences in structural studies that use electron microscopy techniques on many different materials. Among 77 papers are discussions of the art and application of large angle convergent beam electron diffraction, near grain boundary behavior of aluminum bicrystals deformed in plane strain conditions, the structure and morphology of thin films deposited by pulsed laser deposition techniques, the positive hydrogen effect in structure surface layers on titanium alloys, and microstructural changes induced during the hydrogen charging process in stainless steels with and without nitrided layers. Englisch, Ebook.
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