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Helium Ion Microscopy100%: Armin Gölzhäuser: Helium Ion Microscopy (ISBN: 9783319824734) in Englisch, Taschenbuch.
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Helium Ion Microscopy60%: Gregor Hlawacek: Helium Ion Microscopy (ISBN: 9783319419886) 2016, in Englisch, Broschiert.
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Helium Ion Microscopy43%: Armin Gölzhäuser, Gregor Hlawacek: Helium Ion Microscopy (ISBN: 9783319419909) 2016, in Deutsch, auch als eBook.
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Helium Ion Microscopy - 16 Angebote vergleichen

PreiseSep. 18Jan. 20Mai 20
SchnittFr. 177.74 ( 181.76)¹ Fr. 180.60 ( 184.68)¹ Fr. 177.92 ( 181.94)¹
Nachfrage
Bester Preis: Fr. 152.05 ( 155.49)¹ (vom 19.01.2020)
1
9783319419886 - Gregor Hlawacek: Helium Ion Microscopy
Gregor Hlawacek

Helium Ion Microscopy (2016)

Lieferung erfolgt aus/von: Deutschland ~EN NW

ISBN: 9783319419886 bzw. 3319419889, vermutlich in Englisch, 526 Seiten, Springer-Verlag GmbH, neu.

Fr. 177.87 ( 181.89)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, buchversandmimpf2000, [3715720].
Neuware - This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content. 01.10.2016, Buch, Neuware, 241x161x38 mm, 972g, 526, PayPal, Banküberweisung.
2
9783319824734 - Helium Ion Microscopy. -

Helium Ion Microscopy. -

Lieferung erfolgt aus/von: Deutschland DE NW

ISBN: 9783319824734 bzw. 3319824732, in Deutsch, Springer, neu.

Fr. 177.87 ( 181.89)¹
unverbindlich
Lieferung aus: Deutschland, zzgl. Versandkosten, in stock, lieferbar.
Helium Ion Microscopy. This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical d... Buch.
3
9783319824734 - Armin Gölzhäuser: Helium Ion Microscopy
Symbolbild
Armin Gölzhäuser

Helium Ion Microscopy (2018)

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783319824734 bzw. 3319824732, vermutlich in Englisch, Springer International Publishing Jun 2018, Taschenbuch, neu.

Fr. 177.87 ( 181.89)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, AHA-BUCH GmbH [51283250], Einbeck, Germany.
Neuware - This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content. 552 pp. Englisch.
4
9783319419886 - Gregor Hlawacek: Helium Ion Microscopy
Gregor Hlawacek

Helium Ion Microscopy (2016)

Lieferung erfolgt aus/von: Deutschland ~EN NW

ISBN: 9783319419886 bzw. 3319419889, vermutlich in Englisch, Springer-Verlag Gmbh Okt 2016, neu.

Fr. 177.87 ( 181.89)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, AHA-BUCH GmbH [51283250], Einbeck, Germany.
Neuware - This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content. 526 pp. Englisch.
5
9783319824734 - Gregor Hlawacek; Armin Gölzhäuser: Helium Ion Microscopy
Gregor Hlawacek; Armin Gölzhäuser

Helium Ion Microscopy

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783319824734 bzw. 3319824732, vermutlich in Englisch, Springer Shop, Taschenbuch, neu.

Fr. 177.87 ( 181.89)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Lagernd.
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content. Soft cover.
6
9783319419886 - Gregor Hlawacek; Armin Gölzhäuser: Helium Ion Microscopy
Gregor Hlawacek; Armin Gölzhäuser

Helium Ion Microscopy

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika ~EN HC NW

ISBN: 9783319419886 bzw. 3319419889, vermutlich in Englisch, Springer Shop, gebundenes Buch, neu.

Fr. 191.23 ($ 219.99)¹
unverbindlich
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content. Hard cover.
7
9783319824734 - Armin Gölzhäuser: Helium Ion Microscopy
Armin Gölzhäuser

Helium Ion Microscopy (2018)

Lieferung erfolgt aus/von: Deutschland ~EN PB NW

ISBN: 9783319824734 bzw. 3319824732, vermutlich in Englisch, 552 Seiten, Springer International Publishing, Taschenbuch, neu.

Fr. 177.87 ( 181.89)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Mein Buchshop, [4021159].
Neuware - This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content. 16.06.2018, Taschenbuch, Neuware, 235x155x29 mm, 824g, 552, Internationaler Versand, PayPal, Offene Rechnung, Banküberweisung.
8
9783319824734 - Helium Ion Microscopy Gregor Hlawacek Editor

Helium Ion Microscopy Gregor Hlawacek Editor

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika ~EN PB NW

ISBN: 9783319824734 bzw. 3319824732, vermutlich in Englisch, Springer International Publishing, Taschenbuch, neu.

Fr. 193.67 ($ 219.99)¹
unverbindlich
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.
9
9783319419886 - Helium Ion Microscopy Gregor Hlawacek Editor

Helium Ion Microscopy Gregor Hlawacek Editor

Lieferung erfolgt aus/von: Vereinigte Staaten von Amerika ~EN HC NW

ISBN: 9783319419886 bzw. 3319419889, vermutlich in Englisch, Springer International Publishing, gebundenes Buch, neu.

Fr. 187.94 ($ 213.49)¹
unverbindlich
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.
10
9783319419886 - Helium Ion Microscopy, Gebunden

Helium Ion Microscopy, Gebunden

Lieferung erfolgt aus/von: Deutschland DE HC NW

ISBN: 9783319419886 bzw. 3319419889, in Deutsch, Springer, gebundenes Buch, neu.

Fr. 230.19 ( 235.39)¹
unverbindlich
Lieferung aus: Deutschland, zzgl. Versandkosten, in stock.
This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are discussed in an extra section. The structure of the book allows the novice to get acquainted with the specifics of the technique needed to understand the more applied chapters in the second half of the volume. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field. This includes imaging of biological samples, resist and precursor based nanofabrication, applications in semiconductor industry, using Helium as well as Neon and many more. The fundamental part allows the regular HIM user to deepen his understanding of the method. A final chapter by Bill Ward, one of the pioneers of HIM, covering the historical developments leading to the existing tool complements the content.
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