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100%: Claeys, C. et al (Eds.): Metal Impurities in Silicon- and Germanium-Based Technologies. Origin, Characterization, Control, and Device Impact. (ISBN: 9783319939247) 2018, in Englisch, Broschiert.Nur diese Ausgabe anzeigen…
100%: Cor Claeys, Mitwirkende: Eddy Simoen: Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270) (ISBN: 9783030067472) 2019, in Englisch, Band: 270, Taschenbuch.Nur diese Ausgabe anzeigen…
Metal Impurities in Silicon- and Germanium-Based Technologies. Origin, Characterization, Control, and Device Impact.
13 Angebote vergleichen
| Preise | 2018 | 2020 | 2021 |
|---|---|---|---|
| Schnitt | Fr. 136.64 (€ 139.73)¹ | Fr. 130.87 (€ 133.82)¹ | Fr. 80.19 (€ 82.00)¹ |
| Nachfrage |
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Metal Impurities in Silicon- And Germanium-Based Technologies (2019)
DE NW RPISBN: 9783030067472 bzw. 3030067475, in Deutsch, Springer, neu, Nachdruck.
Von Händler/Antiquariat, Paperbackshop-US [8408184], Wood Dale, IL, U.S.A.
New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
New Book. Shipped from US within 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
2
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Metal Impurities in Silicon- And Germanium-Based Technologies (2019)
DE NW RPISBN: 9783030067472 bzw. 3030067475, in Deutsch, Springer, neu, Nachdruck.
Von Händler/Antiquariat, Books2Anywhere [190245], Fairford, GLOS, United Kingdom.
New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
3
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Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Paperback) (2019)
DE PB NWISBN: 9783030067472 bzw. 3030067475, in Deutsch, Springer, United States, Taschenbuch, neu.
Von Händler/Antiquariat, The Book Depository EURO [60485773], London, United Kingdom.
Language: English. Brand new Book. This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
Language: English. Brand new Book. This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.
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Metal Impurities in Silicon- and Germanium-Based Technologies. Origin, Characterization, Control, and Device Impact. (2018)
~EN HC USISBN: 9783319939247 bzw. 3319939246, vermutlich in Englisch, Cham, Springer. gebundenes Buch, gebraucht, guter Zustand.
Von Händler/Antiquariat, Antiquariat im Hufelandhaus GmbH [2726420], Berlin, Germany.
xxxiii, 438 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestossen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch. Books.
xxxiii, 438 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestossen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch. Books.
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Metal Impurities in Silicon and Germanium-Based Technologies - Origin, Characterization, Control and Device Impact
DE HC NWISBN: 9783319939247 bzw. 3319939246, in Deutsch, Springer-Verlag Gmbh, gebundenes Buch, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
Metal Impurities in Silicon and Germanium-Based Technologies: This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices` performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering. Englisch, Buch.
Metal Impurities in Silicon and Germanium-Based Technologies: This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices` performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering. Englisch, Buch.
6
Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (Springer Series in Materials Science, Band 270) (2019)
EN PB NWISBN: 9783030067472 bzw. 3030067475, Band: 270, in Englisch, 472 Seiten, Springer, Taschenbuch, neu.
Lieferung aus: Deutschland, Noch nicht erschienen. Versandkostenfrei.
Von Händler/Antiquariat, Amazon.de.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Von Händler/Antiquariat, Amazon.de.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
7
Metal Impurities in Silicon and Germanium-Based Technologies (2018)
~EN HC NWISBN: 9783319939247 bzw. 3319939246, vermutlich in Englisch, gebundenes Buch, neu.
Lieferung aus: Deutschland, Next Day, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
8
Metal Impurities in Silicon and Germanium-Based Technologies (2018)
~EN HC NWISBN: 9783319939247 bzw. 3319939246, vermutlich in Englisch, gebundenes Buch, neu.
Lieferung aus: Deutschland, Next Day, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
9
Metal Impurities in Silicon and Germanium-Based Technologies Origin, Characterization, Control and Device Impact (2018)
~EN NWISBN: 3319939246 bzw. 9783319939247, vermutlich in Englisch, Springer-Verlag GmbH; Springer International Publishing, neu.
Von Händler/Antiquariat, MARZIES.de Buch- und Medienhandel, 14621 Schönwalde-Glien.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
10
Metal Impurities in Silicon- and Germanium-Based Technologies (2019)
~EN PB NW RPISBN: 9783030067472 bzw. 3030067475, vermutlich in Englisch, Taschenbuch, neu, Nachdruck.
Lieferung aus: Deutschland, Next Day, Versandkostenfrei.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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