Measurement of seeded defect width in the bearing using Sym5 wavelet als von
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9783330087262 - Manpreet Singh: Measurement of seeded defect width in the bearing using Sym5 wavelet
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Manpreet Singh

Measurement of seeded defect width in the bearing using Sym5 wavelet (2017)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783330087262 bzw. 3330087269, in Deutsch, LAP Lambert Academic Publishing Jun 2017, Taschenbuch, neu.

Fr. 63.47 ( 64.90)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, AHA-BUCH GmbH [51283250], Einbeck, Germany.
Neuware - This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring. 168 pp. Englisch.
2
9783330087262 - Manpreet Singh: Measurement of seeded defect width in the bearing using Sym5 wavelet
Manpreet Singh

Measurement of seeded defect width in the bearing using Sym5 wavelet (2017)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783330087262 bzw. 3330087269, in Deutsch, 168 Seiten, LAP Lambert Academic Publishing, Taschenbuch, neu.

Fr. 63.47 ( 64.90)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Buchhandlung - Bides GbR, [4124740].
Neuware - This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring. - Besorgungstitel - vorauss. Lieferzeit 3-5 Tage. 13.06.2017, Taschenbuch, Neuware, 220x150x10 mm, 267g, 168, Internationaler Versand, offene Rechnung (Vorkasse vorbehalten), PayPal, Kreditkarte, Banküberweisung.
3
9783330087262 - Manpreet Singh: Measurement of seeded defect width in the bearing using Sym5 wavelet
Manpreet Singh

Measurement of seeded defect width in the bearing using Sym5 wavelet (2017)

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783330087262 bzw. 3330087269, in Deutsch, 168 Seiten, LAP Lambert Academic Publishing, Taschenbuch, neu.

Fr. 63.47 ( 64.90)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkosten nach: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, Sparbuchladen, [3602074].
Neuware - This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring. -, 13.06.2017, Taschenbuch, Neuware, 220x150x10 mm, 267g, 168, Internationaler Versand, offene Rechnung (Vorkasse vorbehalten), Selbstabholung und Barzahlung, PayPal, Banküberweisung.
4
9783330087262 - Singh, Manpreet: Measurement of seeded defect width in the bearing using Sym5 wavelet
Symbolbild
Singh, Manpreet

Measurement of seeded defect width in the bearing using Sym5 wavelet

Lieferung erfolgt aus/von: Deutschland DE PB NW

ISBN: 9783330087262 bzw. 3330087269, in Deutsch, Taschenbuch, neu.

Fr. 62.58 ( 63.99)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, European-Media-Service Mannheim [1048135], Mannheim, Germany.
Publisher/Verlag: LAP Lambert Academic Publishing | This book is a great source for those who are working in the field of condition monitoring. Identifying the high frequency events in a signal is comparatively easy but this book elaborates about to spotting low frequency in detail which could be great source for the researchers working in this field. In addition, this book is an extract of different types of techniques being used in the field of condition monitoring. | Format: Paperback | Language/Sprache: english | 168 pp.
5
9783330087262 - Manpreet Singh: Measurement of seeded defect width in the bearing using Sym5 wavelet
Manpreet Singh

Measurement of seeded defect width in the bearing using Sym5 wavelet (2017)

Lieferung erfolgt aus/von: Deutschland EN PB NW

ISBN: 9783330087262 bzw. 3330087269, in Englisch, 168 Seiten, LAP LAMBERT Academic Publishing, Taschenbuch, neu.

Fr. 55.90 ( 57.16)¹
versandkostenfrei, unverbindlich
Lieferung aus: Deutschland, Versandfertig in 1 - 2 Werktagen, Versandkostenfrei.
Von Händler/Antiquariat, dodax-shop-eu.
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