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100%: Fuchs, Ekkehard; Oppolzer, Helmut; Rehme, Hans: Particle Beam Microanalysis : Fundamentals, Methods and Applications (ISBN: 9783527268849) 1990, in Englisch, Broschiert.
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83%: Fuchs, E., Oppolzer, H., Rehme, H.: Particle Beam Microanalysis: Fundamentals, Methods and Applications (ISBN: 9780895735058) 1991, VCH Publishing, in Englisch, Broschiert.
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Particle Beam Microanalysis : Fundamentals, Methods and Applications
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Bester Preis: Fr. 28.26 (€ 28.87)¹ (vom 20.04.2018)1
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Particle Beam Microanalysis : Fundamentals, Methods and Applications
DE HC US
ISBN: 9783527268849 bzw. 3527268847, in Deutsch, Wiley & Sons, Incorporated, John, gebundenes Buch, gebraucht.
Von Händler/Antiquariat, ThriftBooks - Free State [56683468], Halethorpe, MD, U.S.A.
A copy that has been read, but remains in clean condition. All pages are intact, and the cover is intact. The spine may show signs of wear. Pages can include limited notes and highlighting, and the copy can include previous owner inscriptions. An ex-library book and may have standard library stamps and/or stickers. At ThriftBooks, our motto is: Read More, Spend Less.
A copy that has been read, but remains in clean condition. All pages are intact, and the cover is intact. The spine may show signs of wear. Pages can include limited notes and highlighting, and the copy can include previous owner inscriptions. An ex-library book and may have standard library stamps and/or stickers. At ThriftBooks, our motto is: Read More, Spend Less.
2
Particle Beam Microanalysis: Fundamentals, Methods and Applications
EN US
ISBN: 9780895735058 bzw. 0895735059, in Englisch, VCH Publishing, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, free shipping to: USA.
Von Händler/Antiquariat, Better World Books.
VCH Publishing. Used - Good. Former Library book. Shows some signs of wear, and may have some markings on the inside.
Von Händler/Antiquariat, Better World Books.
VCH Publishing. Used - Good. Former Library book. Shows some signs of wear, and may have some markings on the inside.
3
Particle Beam Microanalysis: Fundamentals, Methods and Applications (1991)
EN US
ISBN: 9780895735058 bzw. 0895735059, in Englisch, VCH Publishing, gebraucht.
Lieferung aus: Vereinigte Staaten von Amerika, Free shipping.
Von Händler/Antiquariat, Better World Books [51315977], Mishawaka, IN, U.S.A.
Former Library book. Shows some signs of wear, and may have some markings on the inside.
Von Händler/Antiquariat, Better World Books [51315977], Mishawaka, IN, U.S.A.
Former Library book. Shows some signs of wear, and may have some markings on the inside.
4
Particle Beam Microanalysis: Fundamentals, Methods and Applications (1991)
EN HC NW
ISBN: 9780895735058 bzw. 0895735059, in Englisch, VCH Publishing, gebundenes Buch, neu.
Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 1-2 business days, Real shipping costs can differ.
Von Händler/Antiquariat, Near_Books.
Particle beam methods of microanalysis allow high lateral and vertical resolution, high sensitivity, low detection limits, and high accuracy. This book concentrates on methods which complement each other and can be routinely applied in industrial laboratories: scanning and transmission electron microscopy, electron beam X-ray microanalysis, Auger electron microanalysis, and ion beam microanalysis as well as electron beam testing. The principal aim of this book is to support the analyst in his practical work. The theoretical basis is treated only to the extent required to obtain an understanding of the physical fundamentals and to allow effective use of the analytical instruments. The mode of operation of the instruments, the preparation of specimens, the evaluation of the measured signals as well as the detection limits are described in detail. A selection of practical examples drawn mainly from the field of semiconductor technology demonstrates the range of applications and the limitations of the various particle beam methods. Hardcover, Label: VCH Publishing, VCH Publishing, Product group: Book, Published: 1991-02, Studio: VCH Publishing, Sales rank: 19712420.
Von Händler/Antiquariat, Near_Books.
Particle beam methods of microanalysis allow high lateral and vertical resolution, high sensitivity, low detection limits, and high accuracy. This book concentrates on methods which complement each other and can be routinely applied in industrial laboratories: scanning and transmission electron microscopy, electron beam X-ray microanalysis, Auger electron microanalysis, and ion beam microanalysis as well as electron beam testing. The principal aim of this book is to support the analyst in his practical work. The theoretical basis is treated only to the extent required to obtain an understanding of the physical fundamentals and to allow effective use of the analytical instruments. The mode of operation of the instruments, the preparation of specimens, the evaluation of the measured signals as well as the detection limits are described in detail. A selection of practical examples drawn mainly from the field of semiconductor technology demonstrates the range of applications and the limitations of the various particle beam methods. Hardcover, Label: VCH Publishing, VCH Publishing, Product group: Book, Published: 1991-02, Studio: VCH Publishing, Sales rank: 19712420.
6
Particle Beam Microanalysis: Fundamentals, Methods and Applications (1990)
EN HC US
ISBN: 9783527268849 bzw. 3527268847, in Englisch, 507 Seiten, Wiley-VCH, gebundenes Buch, gebraucht.
Lieferung aus: Deutschland, Versandfertig in 1 - 2 Werktagen, Tatsächliche Versandkosten können abweichen.
Von Händler/Antiquariat, Books N planet.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Von Händler/Antiquariat, Books N planet.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
7
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Particle Beam Micronalysis. (1990)
DE HC
ISBN: 9783527268849 bzw. 3527268847, in Deutsch, Wiley-VCH, Weinheim, Deutschland, gebundenes Buch.
Von Händler/Antiquariat, Antiquariat Dorner [1047787], Reinheim, Germany.
Fundamentals, Methods and Applications. Weinheim, VCH 1990. XVIII, 507 S., OPappband Titel mit Besitzvermerk, sonst gut.
Fundamentals, Methods and Applications. Weinheim, VCH 1990. XVIII, 507 S., OPappband Titel mit Besitzvermerk, sonst gut.
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