Analysis of Sensitivity and Resolution in Pla . 9783659422966 | dpd Versand
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Preise | 2013 | 2014 | 2015 |
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Schnitt | Fr. 55.94 (€ 57.16)¹ | Fr. 56.62 (€ 57.85)¹ | Fr. 68.55 (€ 70.04)¹ |
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Analysis of Sensitivity and Resolution in Plasmonic Microscopes (Paperback) (2013)
DE PB NW RP
ISBN: 9783659422966 bzw. 3659422967, in Deutsch, LAP Lambert Academic Publishing, United States, Taschenbuch, neu, Nachdruck.
Lieferung aus: Deutschland, Versandkostenfrei.
Von Händler/Antiquariat, The Book Depository EURO [60485773], Slough, United Kingdom.
Language: English Brand New Book ***** Print on Demand *****.This book provides readers a theoretical framework to understand different types of surface plasmon (SP) microscope setups through the rigorous diffraction theory. The framework analyses the diffraction process through rigorous wave coupled analysis (RCWA) and a software package processes the diffracted orders to recover the microscope response for a range of different systems. In this book I will investigate the non-interferometric SP microscope, interferometric SP microscope and confocal SP microscope. I will show that the non-interferometric system exhibits a trade-off between lateral resolution and sensitivity, where an image obtained with a good contrast will have low lateral resolution. In order to get around the trade-off, the interferometric system can be employed; however, the main challenge for the interferometric setup is its optical alignment. I will show that a confocal SP microscope, which has been developed as a part of my doctoral degree, can simplify the complexity of the interferometric system and give similar measurement performance.
Von Händler/Antiquariat, The Book Depository EURO [60485773], Slough, United Kingdom.
Language: English Brand New Book ***** Print on Demand *****.This book provides readers a theoretical framework to understand different types of surface plasmon (SP) microscope setups through the rigorous diffraction theory. The framework analyses the diffraction process through rigorous wave coupled analysis (RCWA) and a software package processes the diffracted orders to recover the microscope response for a range of different systems. In this book I will investigate the non-interferometric SP microscope, interferometric SP microscope and confocal SP microscope. I will show that the non-interferometric system exhibits a trade-off between lateral resolution and sensitivity, where an image obtained with a good contrast will have low lateral resolution. In order to get around the trade-off, the interferometric system can be employed; however, the main challenge for the interferometric setup is its optical alignment. I will show that a confocal SP microscope, which has been developed as a part of my doctoral degree, can simplify the complexity of the interferometric system and give similar measurement performance.
2
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Analysis of Sensitivity and Resolution in Plasmonic Microscopes (2015)
DE PB NW
ISBN: 9783659422966 bzw. 3659422967, in Deutsch, LAP LAMBERT ACADEMIC PUB 01/03/2015, Taschenbuch, neu.
Von Händler/Antiquariat, Paperbackshop-US [8408184], Secaucus, NJ, U.S.A.
New Book. Shipped from US within 10 to 14 business days. Established seller since 2000. This item is printed on demand.
New Book. Shipped from US within 10 to 14 business days. Established seller since 2000. This item is printed on demand.
3
Analysis of Sensitivity and Resolution in Plasmonic Microscopes (2013)
EN PB NW
ISBN: 9783659422966 bzw. 3659422967, in Englisch, 284 Seiten, LAP LAMBERT Academic Publishing, Taschenbuch, neu.
Neu ab: $75.98 (9 Angebote)
Gebraucht ab: $88.93 (2 Angebote)
Zu den weiteren 11 Angeboten bei Amazon.com
Lieferung aus: Vereinigte Staaten von Amerika, Usually ships in 1-2 business days.
Von Händler/Antiquariat, Serendipity UnLtd.
This book provides readers a theoretical framework to understand different types of surface plasmon (SP) microscope setups through the rigorous diffraction theory. The framework analyses the diffraction process through rigorous wave coupled analysis (RCWA) and a software package processes the diffracted orders to recover the microscope response for a range of different systems. In this book I will investigate the non-interferometric SP microscope, interferometric SP microscope and confocal SP microscope. I will show that the non-interferometric system exhibits a trade-off between lateral resolution and sensitivity, where an image obtained with a good contrast will have low lateral resolution. In order to get around the trade-off, the interferometric system can be employed; however, the main challenge for the interferometric setup is its optical alignment. I will show that a confocal SP microscope, which has been developed as a part of my doctoral degree, can simplify the complexity of the interferometric system and give similar measurement performance. Paperback, Label: LAP LAMBERT Academic Publishing, LAP LAMBERT Academic Publishing, Produktgruppe: Book, Publiziert: 2013-08-14, Freigegeben: 2013-08-14, Studio: LAP LAMBERT Academic Publishing.
Von Händler/Antiquariat, Serendipity UnLtd.
This book provides readers a theoretical framework to understand different types of surface plasmon (SP) microscope setups through the rigorous diffraction theory. The framework analyses the diffraction process through rigorous wave coupled analysis (RCWA) and a software package processes the diffracted orders to recover the microscope response for a range of different systems. In this book I will investigate the non-interferometric SP microscope, interferometric SP microscope and confocal SP microscope. I will show that the non-interferometric system exhibits a trade-off between lateral resolution and sensitivity, where an image obtained with a good contrast will have low lateral resolution. In order to get around the trade-off, the interferometric system can be employed; however, the main challenge for the interferometric setup is its optical alignment. I will show that a confocal SP microscope, which has been developed as a part of my doctoral degree, can simplify the complexity of the interferometric system and give similar measurement performance. Paperback, Label: LAP LAMBERT Academic Publishing, LAP LAMBERT Academic Publishing, Produktgruppe: Book, Publiziert: 2013-08-14, Freigegeben: 2013-08-14, Studio: LAP LAMBERT Academic Publishing.
4
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Analysis of Sensitivity and Resolution in Plasmonic Microscopes (2014)
DE PB NW
ISBN: 9783659422966 bzw. 3659422967, in Deutsch, LAP LAMBERT ACADEMIC PUB 01/12/2014, Taschenbuch, neu.
Von Händler/Antiquariat, Books2Anywhere [190245], Fairford, United Kingdom.
New Book. Shipped from UK. This item is printed on demand.
New Book. Shipped from UK. This item is printed on demand.
5
Analysis of Sensitivity and Resolution in Plasmonic Microscopes (2013)
EN NW
ISBN: 9783659422966 bzw. 3659422967, in Englisch, 284 Seiten, LAP Lambert Academic Publishing, neu.
Neu ab: EUR 56,06 (6 Angebote)
Zu den weiteren 6 Angeboten bei Amazon.fr (Int.)
Lieferung aus: Frankreich, Expédition sous 1 à 2 jours ouvrés.
Von Händler/Antiquariat, tousbouquins.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
Von Händler/Antiquariat, tousbouquins.
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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