Falls Sie nur an einem bestimmten Exempar interessiert sind, können Sie aus der folgenden Liste jenes wählen, an dem Sie interessiert sind:
Nur diese Ausgabe anzeigen…
Nur diese Ausgabe anzeigen…
High-Resolution Imaging and Spectrometry of Materials
14 Angebote vergleichen
Preise | 2018 | 2019 | 2021 |
---|---|---|---|
Schnitt | Fr. 0.00 (€ 0.00)¹ | Fr. 141.74 (€ 144.95)¹ | Fr. 146.48 (€ 149.79)¹ |
Nachfrage |
High-Resolution Imaging and Spectrometry of Materials
ISBN: 9783642075254 bzw. 3642075258, in Englisch, Springer Berlin Heidelberg, Springer Berlin Heidelberg, gebraucht.
This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
High-Resolution Imaging and Spectrometry of Materials (1997)
ISBN: 9783642075254 bzw. 3642075258, vermutlich in Englisch, Springer Shop, Taschenbuch, neu.
The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. Soft cover.
High-Resolution Imaging and Spectrometry of Materials (1997)
ISBN: 9783662077665 bzw. 3662077663, vermutlich in Englisch, Springer Shop, neu, E-Book, elektronischer Download.
The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. eBook.
High-Resolution Imaging and Spectrometry of Materials (1997)
ISBN: 9783662077665 bzw. 3662077663, in Englisch, neu, E-Book, elektronischer Download.
The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science.
High-Resolution Imaging and Spectrometry of Materials (1997)
ISBN: 9783662077665 bzw. 3662077663, vermutlich in Englisch, Springer Berlin Heidelberg, neu, E-Book, elektronischer Download.
High-Resolution Imaging and Spectrometry of Materials: The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "e critical"e regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma- terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. Englisch, Ebook.
High-Resolution Imaging and Spectrometry of Materials (Springer Series in Materials Science) (2013)
ISBN: 9783662077665 bzw. 3662077663, in Englisch, 442 Seiten, 2003. Ausgabe, Springer, neu, E-Book, elektronischer Download.
The characterisation of materials and material systems is an essential aspect of materials science. A few decades ago it became obvious that, because the properties of materials depend so critically on the microstructure of their components, this characterisation must be determined to the atomic level. This means that the position - as well as the nature - of individual atoms has to be determined at "critical" regions close to defects such as dislocations, interfaces, and surfaces. The great impact of advanced transmission electron microscopy (TEM) techniques became apparent in the area of semiconducting materials, where the nature of internal interfaces between silicon and the corresponding silicides could be identified, and the results used to enhance the understanding of the properties of the compounds studied. At that time, advanced TEM techniques existed predominantly in the US. However, advanced TEM instrumentation was not available in the ma terials science and solid-state science communities in Germany. This gap was bridged by the late Peter Haasen who, after a visit to the US, initiated a Priority Programme on Microstructural Characterisation at the Volkswagen Foundation (Hannover). The programme was in effect from 1985 to 1997 and supported a wide range of research projects - from fundamental, trendy, innovative projects to projects in applied materials science. Kindle Edition, Ausgabe: 2003, Format: Kindle eBook, Label: Springer, Springer, Produktgruppe: eBooks, Publiziert: 2013-03-09, Freigegeben: 2013-03-09, Studio: Springer.
High-Resolution Imaging and Spectrometry of Materials (2010)
ISBN: 9783642075254 bzw. 3642075258, in Deutsch, Springer, Taschenbuch, neu.
9783642075254 Paperback, This listing is a new book, a title currently in-print which we order directly and immediately from the publisher.
High-Resolution Imaging and Spectrometry of Materials
ISBN: 9783662077665 bzw. 3662077663, vermutlich in Englisch, Taschenbuch, neu.