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100%: Sayre, David (Editor)/ Howells, Malcolm (Editor)/ Kirz, Janos (Editor)/ Rarback, Harvey (Editor): X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Paperback) (ISBN: 9783662144909) in Deutsch, Taschenbuch.Nur diese Ausgabe anzeigen…
100%: David Sayre; Malcolm Howells; Janos Kirz; Harvey Rarback: X-Ray Microscopy II : Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (ISBN: 9783540392460) 1987, in Englisch, auch als eBook.Nur diese Ausgabe anzeigen…
82%: Sous la direction de: David Sayre, Sous la direction de: Malcolm Howells, Sous la direction de: Janos Kirz, Sous la direction de: Harvey Rarback: X-ray microscopy II. Proceedings of the International Symposium, Brookhaven, NY, August 31 - September 4, 1987. (Springer series in optical sciences, vol.56).Springer Berlin, 1988 (ISBN: 9783540193920) 1988, in Deutsch, Broschiert.
Nur diese Ausgabe anzeigen…
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63%: D. Sayre, M. Howells, J. Kirz, H. Rarback (Editor): X-Ray Microscopy II: Proceedings of the International Symposium (Springer Series in Optical Sciences) (ISBN: 9780387193922) 1988, Springer-Verlag, Erstausgabe, in Englisch, Broschiert.Nur diese Ausgabe anzeigen…
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Paperback)
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1
X-Ray Microscopy II (1987)
~EN NW EB DLISBN: 9783540392460 bzw. 3540392467, vermutlich in Englisch, Springer Shop, neu, E-Book, elektronischer Download.
Lieferung aus: Deutschland, Lagernd.
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation. eBook.
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation. eBook.
2
X-Ray Microscopy II (1987)
EN NW EB DLISBN: 9783540392460 bzw. 3540392467, in Englisch, Springer, Berlin/Heidelberg, Deutschland, neu, E-Book, elektronischer Download.
Lieferung aus: Vereinigte Staaten von Amerika, Lagernd, zzgl. Versandkosten.
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.
This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation.
3
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Springer Series in Optical Sciences) (1988)
EN HC USISBN: 9783540193920 bzw. 3540193928, in Englisch, 454 Seiten, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, gebundenes Buch, gebraucht.
Lieferung aus: Vereinigtes Königreich Grossbritannien und Nordirland, Usually dispatched within 1-2 business days.
Von Händler/Antiquariat, rbmbooks.
Hardcover, Label: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Produktgruppe: Book, Publiziert: 1988-12-31, Studio: Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
Von Händler/Antiquariat, rbmbooks.
Hardcover, Label: Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Springer-Verlag Berlin and Heidelberg GmbH & Co. K, Produktgruppe: Book, Publiziert: 1988-12-31, Studio: Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
4
X-ray microscopy II. Proceedings of the International Symposium, Brookhaven, NY, August 31 - September 4, 1987.
DE HC USISBN: 9783540193920 bzw. 3540193928, in Deutsch, Berlin : Springer, 1988. gebundenes Buch, gebraucht.
Antiquariat Michael Schenck, [3134722].
XIV, 454 Seiten. "With 306 Figures". 24x16 cm. Pappband. (= Springer series in optical sciences. Vol. 56).Min. Lagerspuren. Sehr guter Zustand. Hardcover.
XIV, 454 Seiten. "With 306 Figures". 24x16 cm. Pappband. (= Springer series in optical sciences. Vol. 56).Min. Lagerspuren. Sehr guter Zustand. Hardcover.
5
X-ray microscopy II. Proceedings of the International Symposium, Brookhaven, NY, August 31 - September 4, 1987.
DE USISBN: 3540193928 bzw. 9783540193920, in Deutsch, Berlin : Springer, 1988. gebraucht.
Lieferung aus: Deutschland, Versandart: STD, Versand nach: DE.
Von Händler/Antiquariat, Antiquariat Michael Schenck, [1022].
Min. Lagerspuren. Sehr guter Zustand. XIV, 454 Seiten. "With 306 Figures". 24x16 cm. Pappband. (= Springer series in optical sciences. Vol. 56).
Von Händler/Antiquariat, Antiquariat Michael Schenck, [1022].
Min. Lagerspuren. Sehr guter Zustand. XIV, 454 Seiten. "With 306 Figures". 24x16 cm. Pappband. (= Springer series in optical sciences. Vol. 56).
6
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31 September 4, 1987 (1987)
DE PB NWISBN: 9783662144909 bzw. 3662144905, in Deutsch, Springer, Taschenbuch, neu.
Von Händler/Antiquariat, BuySomeBooks [52360437], Las Vegas, NV, U.S.A.
Paperback. 455 pages. Dimensions: 9.0in. x 6.0in. x 1.1in.This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN.
Paperback. 455 pages. Dimensions: 9.0in. x 6.0in. x 1.1in.This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready form. We thank the authors for their con tributions and for their efforts in adhering to the guidelines on manuscript preparation. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN.
7
X-Ray Microscopy II
DE PB NWISBN: 9783662144909 bzw. 3662144905, in Deutsch, Springer, Berlin Springer Berlin Heidelberg, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
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X-Ray Microscopy II
DE PB NWISBN: 9783662144909 bzw. 3662144905, in Deutsch, Springer, Berlin, Taschenbuch, neu.
Lieferung aus: Deutschland, Versandkostenfrei.
buecher.de GmbH & Co. KG, [1].
Die Beschreibung dieses Angebotes ist von geringer Qualität oder in einer Fremdsprache. Trotzdem anzeigen
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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Paperback) (2013)
DE PB NW RPISBN: 9783662144909 bzw. 3662144905, in Deutsch, Springer-Verlag Berlin and Heidelberg GmbH Co. KG, Germany, Taschenbuch, neu, Nachdruck.
Lieferung aus: Vereinigtes Königreich Grossbritannien und Nordirland, Versandkostenfrei.
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X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987 (Springer Series in Optical Sciences) (1988)
DE HC USISBN: 9783540193920 bzw. 3540193928, in Deutsch, Springer, Berlin/Heidelberg, Deutschland, gebundenes Buch, gebraucht.
Von Händler/Antiquariat, The Book Bin [76927], Salem, OR, U.S.A.
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